Malburg, Dr. Mark
Dr. Mark Malburg is the president of Digital Metrology Solutions…
Surface Metrology
-
-
Lakshmipathy, Mr. Manas
Manas Lakshmipathy is color MQE at Apple. He is formerly the Business Development Manager at Polytech and spent 16 years in metrology with Zygo Corporation.
-
-
Wasilesky, Mr. Robert
Bob Wasilesky is the Director of Sales and Marketing at 4D Technology Corporation…
-
Lombardo, Mr.Dale
GE Aerospace Special Process Leader
-
Brown, Dr. Christopher
Christopher Brown is Mechanical & Materials Engineering professor at Worcester Polytechnic Institute (WPI)…
-
Cohen, Dr. Donald
President of Michigan Metrology, LLC
-
Recent advances in the measurement and analysis of surface microgeometry – T. R. Thomas.
Abstract Recent advances are described in the measurement and definition of surface microgeometry, with special emphasis on the role of the stylus instrument. Statistical descriptions of surfaces are discussed and it is shown that the geometry of surface profiles can be specified completely by two parameters, the r.m.s. roughness and the correlation length. Hardware and…
-
The spatial representation of surface roughness by means of the structure function: a practical alternative to correlation – R.S. Sayles, and T. R. Thomas.
Abstract The structure function, which is related simply to the autocorrelation function but is without some of its disadvantages, is proposed as a means of quantifying variations in surface texture. Both profile and surface structure functions can be computed; the latter conveniently shows the effect of anisotropy on roughness. Using the structure function, the plastic…
-
-
-
Fractal characterization of the anisotropy of rough surfaces – T.R. Thomas, B. G. Rosen and N. Amini
Existing techniques for measuring and characterising anisotropy are discussed. The advantages are suggested in treating anisotropic surfaces as self-affine fractals, characterised by two parameters, the fractal dimension and the topothesy. These parameters are conveniently determined experimentally by measuring the slope and intercept of a logarithmic plot of the structure function. A 3D version of the…
