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Key People

The people on this page have made major contributions to one or more areas of metrology. This is not an exhaustive list. If you have someone that you feel belongs on the page, please email info@emetrology.com.

Function
Country
Metrology Type
  • Mr. Pat Stack

    Surface Metrology Software Specialist

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  • Dr. Seiichiro Hara

    Institute of Science Tokyo Dr. Seiichiro Hara is an Associate Professor at the Institute of Science Tokyo (formerly Tokyo Institute of Technology) in the School of Engineering. He is associated with the Department of Systems and Control Engineering and the Department of Mechanical Engineering.

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  • Dr. Wei Gao

    Tohoku University Dr. Wei Gao is a Professor in the Department of Finemechanics at Tohoku University in Sendai, Japan. He holds the position of Chair of the Precision Nanometrology Laboratory and is the Director of the Research Center for Precision Nanosystems within the Graduate School of Engineering. 

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  • Mr. Alex Tabenkin

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  • Professor Derek G. Chetwynd

    A Roundness Metrology Pioneer

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  • Dr. Michael Krystick

    A Distinguished Computational Surface Metrologist

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  • Dr. Bill Grant

    A Distinguished Industrial Metrologist

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  • Thwaite, Mr. Eric

    Fellow (Emeritus). National Measurement Institute. AUSTRALIA.

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  • Prof. Von Weingraber

    Prof. Von Weingraber A Surface Metrology Pioneer. Professor Von Weingraber from Hannover Germany is recognized in the field of surface metrology for his significant contributions to the development of methods for analyzing and characterizing surface topography, particularly by advocating for the concept of an “envelope” to link surface metrology with dimensional metrology, allowing for a…

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  • Lukyanov, Dr. V.S.

    Surface Metrology Luminary Past Chair of ISO Surface Standards Committee

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  • Dr. Janez Peklenik

    Surface Metrology Luminary, a CIRP member in surface metrology group from the University of Ljubljana, Slovenia

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  • Prof. Kazuhisa Yanagi

    A Distinguished Surface Metrologist

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