Abstract Proliferation of redundant parameters for characterizing surface roughness is explained as a historical consequence of the predominant influence of instrument manufacturers over users. Problems of roughness characterization are introduced: high and low-pass filtering, transitional topographies, sampling error. The needs of three classes of user, the machinist, the researcher and the quality control engineer, are…
Abstract A number of specimen surfaces, including machined surfaces and calibration standards, are examined by a stylus instrument on-line to a microcomputer. For each measuement on each specimen 14 roughness parameters are computed for each of 10 profiles, and the mean and standard deviation of each parameter is calculated. Variations of up to 15% are…
Profile measurements of the surface topography of engineering components are often used in attempts to assess the functional suitability of surfaces. This paper reviews the definitions and properties of a large number of parameters which are used to characterize measurements of this type.
Abstract The use of microcomputers for processing surface profiles from stylus instruments has resultedin the availability of a great deal of information. However, a functional databank does not existyet to assist the designer in the selection of proper surface finishes for different applications. Theuse of computers for analyzing surface profiles has also resulted in a…
Abstract In recent years there has been a proliferation of parameters with which to specify surface texture. Some of these parameters are useful, but most are not. The result of this rash is confusion and expense. In this paper the cause of the growth of such parameters is identified and ways of minimizing it are…
The characterization of machined surfaces is becoming an increasingly important activity in todaysquality minded business environment. Historically, these surfaces would have been evaluated using a stylusinstrument but optical instruments are now becoming increasingly prevalent. One instrument, the whitelight vertical scanning interferometer, is even capable of performing a complete three-dimensionalevaluation in a single scan. This paper…
Abstract The surface profile of the Well known surface of a PTB roughness standard has beenrecorded by several methods and the results have been compared. The result of the contactstylus method, in particular that using a very small tip radius, is in good conformity with thatdeduced from SEM stereo images. The optical methods, ie laser…
Abstract Optical techniques have great potential for non-destructive and on-line measurements of surface roughness during manufacturing. This paper reviews the state-of-the-art in a number of optical techniques including specular reflectance, total integrated scatter, diffuseness, angular scattering distributions, speckle, ellipsometry, and interferometry. The distinction is drawn between the more quantitative but slower profiling techniques and less…
Abstract Optical methods are increasingly used for measurement of surface texture, particularly for areal measurements where the optical methods are generally faster. A new Working Group under Technical Committee (TC) 213 in the International Organization for Standardization is addressing standardization issues for areal surface texture measurement and characterization and has formed a project team to…
Abstract This review gathers together 15 special topics in modern interferometric metrology representing a sampling of historical, current and future developments. The selected topics cover a wide range of applications, including distance and displacement measurement, the testing of optical components, interference microscopy for surface structure analysis, form and dimensional measurements of industrial parts, and recent…
This paper deals with a non-contact, optical measuring method which unitesthe assessment of roughness form and waviness in one single instrumenL Themethod is based on the deflection of light which leads to a more or less broadscattered light distribution in the case of roughness and to a shift of the totaldistribution curve due to waviness…
