A comparative study of surface texture measurement using white light scanning interferometry and contact stylus techniques – B.D. Boudreau, J. Raja, H. Sannareddy and Paul Caber

The characterization of machined surfaces is becoming an increasingly important activity in todays
quality minded business environment. Historically, these surfaces would have been evaluated using a stylus
instrument but optical instruments are now becoming increasingly prevalent. One instrument, the white
light vertical scanning interferometer, is even capable of performing a complete three-dimensional
evaluation in a single scan. This paper examines the application of white light vertical scanning
interferometry on machined surfaces. In addition, a quantitative comparison of the results from vertical
scanning interferometry and stylus has been perfomed.