Quantitative characterization of micro-topography: a bibliography of industrial surface metrology – R. J. Pike and Tom R. Thomas

A comprehensive bibliography of surface metrology, the numerical description and analysis of manufactured surfaces, improves access to research on topographic quantification that lies outside the usual Earth-science sources. A brief essay accompanying the 4800 literature citations introduces the field of industrial surface metrology to geomorphologists and other Earth scientists, describes similarities and differences between the two realms, and raises issues to be addressed in any attempt to unify the general practice of surface quantification. A sampling of Internet Web-site
addresses and full abstracts on surface metrology supplements the main bibliography.