
Filtering of surface profiles using fast Fourier transformation – J. Raja and V. Radhakrishnan
Topic: Surface Metrology
Type: Journal Article
An essential preliminary to numerical assessment of roughness is the elimination of waviness. The waviness is usually filtered using analog filters of the capacitance-resistance type. This paper deals with a digital technique to remove the waviness. FFT, one of the important tools of digital signal processing was used to filter surface profiles. This technique was compared with the existing methods available for filtering surface profiles.
J. Raja and V. Radhakrishnan, “Filtering of surface profiles using fast Fourier transformation”, International Journal of Machine Tool Design and Research, Vol. 19, No. 3, pp. 133-42, 1978.