
Comparison of motif combination with mean line and envelope systems used for surface profile analysis. – M.S. Shunmugam
Topic: Surface Metrology
Type: Journal Article
Abstract
The height and spacing characteristics of the surface profile influence the functional behaviour of the manufactured part. A new method known as motif combination has been recommended in French standards to obtain the height and spacing characteristics of the surface profiles. An attempt has been made in this paper to compare motif combination techniques with the mean line and envelope systems, taking practical profiles.
Shunmugam, M. S. “Comparison of motif combination with mean line and envelope systems used for surface profile analysis.” Wear 117.3 (1987): 335-345.