
Advances in large-scale metrology–review and future trends – R.H. Schmitt et al.
Abstract
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.
Schmitt, Robert H., et al. “Advances in large-scale metrology–review and future trends.” CIRP Annals 65.2 (2016): 643-665.