EMI Gage
EMI Gage is an independent supplier of calibration, support, repairs, and accessories for surface texture, form, contour, and roundness measuring instruments.
Surface Metrology
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Precision Devices
PDI develops measurement systems for surface roughness and roundness, including surfometers, profilers, and roundness measurement systems.
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Phase II
Phase II manufacturers surface roughness testers, profilometers, hardness testers, ultrasonic thickness gauges, coating thickness gauges, durometers, vibration meters and force gauges.
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KLA TENCOR
KLA TENCOR manufacutres stylus profilometers (stylus profilometers) for 2D and 3D measurement of step height, surface roughness, bow, and stress.
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Polytec
Polytec manufactures equipment to measure form and surface roughness. including non-contact, 3D topography systems.
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HOMMEL ETAMIC
HOMMEL ETAMIC develops measurement and inspection systems for surface roughness, contour, form, and dimensions, as well as optical surface inspection and shaft measurement.
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BRUKER
Brucker manufctures and supports high performance surface and dimentiional metrology tools for industry and reseaerch.Products include systems across full range of contact and non-contact metrology technolgies.
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Tokyo Seimitsu / ACCRETECH
ACCRETECH (part of the TOKYO SEIMITSU Group) provides semiconductor manufacturing equipment and precision measuring inspection equipment including coordinate measuring machines (CMMs), X-ray CT systems, surface texture and contour measuring instruments, optical shaft measuring systems, and laser interferometers.
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ISO 25178-701:2010 – (GPS) — Surface texture: Areal — Part 701: Calibration and measurement standards for contact (stylus) instruments
Abstract ISO 25178-701:2010 specifies the characteristics of material measures used as measurement standards, the estimation methods of the residual errors, and the calibration methods and tests for acceptance and periodical re-verification for areal surface texture contact (stylus) measurement instruments.
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ISO 25178-700:2022 – (GPS) — Surface texture: Areal — Part 700: Calibration, adjustment and verification of areal topography measuring instruments
Abstract This document specifies generic procedures for the calibration, adjustment and verification of metrological characteristics that areal topography measuring instruments have in common, as stated in ISO 25178-600. Because surface profiles can be extracted from surface topography images, most of the methods described in this document can be adapted to profiling instruments. Instrument-specific issues are not covered…
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ISO 25178-607:2019 – (GPS) — Surface texture: Areal — Part 607: Nominal characteristics of non-contact (confocal microscopy) instruments
Abstract This document describes the influence quantities and instrument characteristics of confocal microscopy systems for areal measurement of surface topography. Because surface profiles can be extracted from surface topography images, the methods described in this document can be applied to profiling measurements as well.
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ISO 25178-606:2015 – (GPS) — Surface texture: Areal — Part 606: Nominal characteristics of non-contact (focus variation) instruments
Abstract ISO 25178-606:2015 defines the metrological characteristics of a particular non-contact method measuring surface texture using a focus variation (FV) sensor.