Advances in the metrological traceability and performance of X-ray computed tomography – Dewulf et al.
X Ray CT/3 Abstract X-ray computed tomography (XCT) is increasingly being used for evaluating quality and conformance of complex products, including assemblies and additively manufactured parts. The metrological performance and traceability of XCT nevertheless remains an important research area that is reviewed in this paper. The error sources influencing XCT measurement results are discussed, along…