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Surface metrology – D. J. Whitehouse

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A review article

Abstract

Some important types of instrumentation for measuring surfaces both past and present are reviewed. Exhaustive lists of instruments and performance are not presented; rather more emphasis is placed on the philosophy of measurement. An attempt is made to classify the surface features and also the function of surfaces as a pre-requisite to measurement. It is revealed that, as the push towards miniaturization is being taken beyond the nanometrology scale, some theoretical restrictions are likely to be encountered.

Whitehouse, David J. “Surface metrology.” Measurement science and technology 8.9 (1997): 955.

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