Two-and three-dimensional analyses of surfaces according to the E-system – M.S. Shunmugam, and V. Radhakrishnan

Abstract

The E-system of roughness measurement can be used either for a two-dimensional or a three-dimensional assessment of surface roughness. The procedure for computing the two- and three-dimensional envelopes from digitized profiles is briefly explained. This method will be useful for verifying the results obtained by practical instruments. The filtering characteristic of the E-system, when used for two- and three-dimensional roughness measurement, is analysed with reference to theoretical profiles. Various skid configurations are studied using a doubly curved skid simulated by a computer.